Aquilos Cryo-FIB milling protocol
Published:
Step 1: Initial Setup
- Write down chamber pressure.
- Fill liquid nitrogen to the tank.
- Cool down the heat exchanger.
- Set N₂ gas flow rate to 180 mg/s.
Step 2: Chamber Check
- Check if there is any sample in the chamber.
Step 3: Grid Loading
- Wait 1 hour after cooling down, then load grids.
Step 4: System Wake-up and Beam Alignment
- Wake up the system.
- Turn Beam On.
- Perform 180° scan rotation for both holders.
- After rotation, ensure the slot is positioned at the bottom of the grid.
Step 5: Grid 1 Mapping Preparation
- Navigate to lowest magnification.
- Press F6 to enable live view.
- Switch to higher magnification.
- Perform coarse focus.
- At 2000x, do fine focus.
- Perform Sigma X and Y alignment.
Step 6: Z-Height Calibration
- In live mode, select Link Z to Forward.
Step 7: Project Setup in MAPS
- Open MAPS.
- Create a new project.
- Change save location to:
\\AS-SPC\SharedData\Chen\20241106
Step 8: Grid 1 Pre-GIS Mapping
- Go to lowest magnification.
- Take a snapshot.
- Add tiles.
- Rename to “Grid1-preGIS”.
- Click Run.
⚠️ Repeat Steps 5–8 for Grid 2.
Step 9: Cryo-CLEM Data Integration
- Import cryo-CLEM data.
- Align the data.
- Add lamella positions.
Step 10: Sputter Coating Preparation
- Increase N₂ gas flow to 210 mg/s.
- Perform Sputter coating using Setting 1 for 15 seconds.
Step 11: GIS Deposition on Grid 1
- Apply GIS to Grid 1 for 10 seconds.
⚠️ Do not exceed 10 seconds. A thick GIS layer will hinder milling efficiency.
Step 12: Post-GIS Coating
- Perform Sputter coating again.
- Reset N₂ gas flow to 180 mg/s.
Step 13: High-Resolution Imaging (Grid 1)
- In XT-UI, take a high-resolution image.
- Save as:
Grid1_afterGIS-XXX.tif.
Step 14: AutoTEM Setup
- Open AutoTEM.
- Change project name.
- Do not change save location (keep as
D:\AuToTEM Cryo\Projects).
Step 15: (intentionally left blank for future use)
Step 16: Lamella Preparation
- Start lamella preparation.
- Manually adjust lamella placement.
- Proceed with milling and thinning step-wise.
Step 17: Manual Fine Polishing
- In AutoTEM, select the lamella → Right click → Go to lamella position.
- Increase tilt angle by +0.5° (e.g., T = 16.5 if stage = 16°).
- Create a rectangle milling pattern, set direction: top to bottom.
- Adjust brightness and contrast using a pattern at the side.
- Position milling pattern on top of the lamella.
- Start milling with 30 pA ion beam.
- Use image shift Y to gently move the lamella into the milling pattern.
- Check lamella thickness with SEM view (2 kV).
A thin lamella should appear black in SEM.
Step 18: Documentation
- In MAPS:
File → Save screenshot as→ Save grid image with lamella positions. - In XT-UI:
- Take SEM and FIB images after focus adjustment.
- Use the finest photo button.
- Save images as:
L2_i.tifL2_s_2kV.tifL2_1200x_2kV.tif(for LM correlation)
- Go to lowest magnification → Take full grid image with SEM.
- Copy entire data folder to the lab server.
Step 19: Shutdown Procedure
- Put the system to Sleep.
⚠️ This is important to prevent ion beam waste.
- Reset N₂ gas flow rate to 12 mg/s.

