Aquilos Cryo-FIB milling protocol

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Step 1: Initial Setup

  • Write down chamber pressure.
  • Fill liquid nitrogen to the tank.
  • Cool down the heat exchanger.
  • Set N₂ gas flow rate to 180 mg/s.

Step 2: Chamber Check

  • Check if there is any sample in the chamber.

Step 3: Grid Loading

  • Wait 1 hour after cooling down, then load grids.

Step 4: System Wake-up and Beam Alignment

  • Wake up the system.
  • Turn Beam On.
  • Perform 180° scan rotation for both holders.
  • After rotation, ensure the slot is positioned at the bottom of the grid.

Step 5: Grid 1 Mapping Preparation

  • Navigate to lowest magnification.
  • Press F6 to enable live view.
  • Switch to higher magnification.
  • Perform coarse focus.
  • At 2000x, do fine focus.
  • Perform Sigma X and Y alignment.

Step 6: Z-Height Calibration

  • In live mode, select Link Z to Forward.

Step 7: Project Setup in MAPS

  • Open MAPS.
  • Create a new project.
  • Change save location to:
    \\AS-SPC\SharedData\Chen\20241106

Step 8: Grid 1 Pre-GIS Mapping

  • Go to lowest magnification.
  • Take a snapshot.
  • Add tiles.
  • Rename to “Grid1-preGIS”.
  • Click Run.

⚠️ Repeat Steps 5–8 for Grid 2.

Step 9: Cryo-CLEM Data Integration

  • Import cryo-CLEM data.
  • Align the data.
  • Add lamella positions.

Step 10: Sputter Coating Preparation

  • Increase N₂ gas flow to 210 mg/s.
  • Perform Sputter coating using Setting 1 for 15 seconds.

Step 11: GIS Deposition on Grid 1

  • Apply GIS to Grid 1 for 10 seconds.

    ⚠️ Do not exceed 10 seconds. A thick GIS layer will hinder milling efficiency.

Step 12: Post-GIS Coating

  • Perform Sputter coating again.
  • Reset N₂ gas flow to 180 mg/s.

Step 13: High-Resolution Imaging (Grid 1)

  • In XT-UI, take a high-resolution image.
  • Save as: Grid1_afterGIS-XXX.tif.

Step 14: AutoTEM Setup

  • Open AutoTEM.
  • Change project name.
  • Do not change save location (keep as D:\AuToTEM Cryo\Projects).

Step 15: (intentionally left blank for future use)

Step 16: Lamella Preparation

  • Start lamella preparation.
  • Manually adjust lamella placement.
  • Proceed with milling and thinning step-wise.

Step 17: Manual Fine Polishing

  1. In AutoTEM, select the lamella → Right click → Go to lamella position.
  2. Increase tilt angle by +0.5° (e.g., T = 16.5 if stage = 16°).
  3. Create a rectangle milling pattern, set direction: top to bottom.
  4. Adjust brightness and contrast using a pattern at the side.
  5. Position milling pattern on top of the lamella.
  6. Start milling with 30 pA ion beam.
  7. Use image shift Y to gently move the lamella into the milling pattern.
  8. Check lamella thickness with SEM view (2 kV).

    A thin lamella should appear black in SEM.

Step 18: Documentation

  • In MAPS:
    File → Save screenshot as → Save grid image with lamella positions.
  • In XT-UI:
    • Take SEM and FIB images after focus adjustment.
    • Use the finest photo button.
    • Save images as:
      • L2_i.tif
      • L2_s_2kV.tif
      • L2_1200x_2kV.tif (for LM correlation)
  • Go to lowest magnification → Take full grid image with SEM.
  • Copy entire data folder to the lab server.

Step 19: Shutdown Procedure

  • Put the system to Sleep.

    ⚠️ This is important to prevent ion beam waste.

  • Reset N₂ gas flow rate to 12 mg/s.